Keywords
microstructure
Crystal defects
Fourier analysis
Ferroelectric materials
How to Cite
Abstract
The paper presents a study concerning the coherence and domain wall effects on the profile of selected X-ray diffraction (XRD) peaks from the ferroelectric system Pb0.92Ln0.08TiO3 (Ln3+ = La3+, Dy3+). The analysis focuses on the hkl-dependent broadening and asymmetry of certain diffraction peaks. The study was conducted using a diffraction model evaluated with experimentally determined parameters from XRD and Transmission Electron Microscopy (TEM). The results show that both coherence effects and domain wall scattering contribute significantly to peak asymmetries and diffuse intensity between (h00)/(00h) doublets. The results also show that these effects are sensitive to domain size being more pronounced in lower-order reflections. The choice of dopant directly impacts microstructural parameters. The study highlights the complexity of quantifying ferroelectric microstructures alone from diffraction data alone.
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